High performance NIR analyzer designed for process control in flour mills.
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• Analyzer with TRUE AlignmentTM spectroscopy (TAS) technology.
• Wavelength precision < 0.005 nm.
• Wavelength accuracy < 0.02 nm.
• Wavelength range: 1100 - 2600 nm.
• Photometric noise full range < 20 μAu.
• Absorbance range up to 3 AU.
• Results in less than 30 seconds.
• Suitable for industrial use (Sealed case for at-line use).
• High resolution touch screen LED display.
The Spectralab uses the near-infrared (NIR) wavelength range from
1100 nm to 2600 nm. This range offers optimal coverage and enables direct and complete transfer of calibrations from competing NIR systems.
The high wavelengths generated by Spectralab contain vital spectral informations on proteins, fats, sugar, starch, fiber, amino acids and other components.
Accurate ash measurement:
The reference method (NF ISO 2171), using the ash furnace, requires 3 hours to provide a result.
The Spectralab provides a result of a precision very close to the method in the ash furnace, in only 30 seconds!
- The more the miller is able to get closer to the maximum value of ash content required by the specifications of his customer, the more he maximizes his income.
With an average error (SEP*) on ash measurement of only 0.017%, the Spectralab makes it possible to minimize this margin of safety. As a result, the flour yield can be increased.
For example, opposite: for a 0.50% target, a classic NIR tool, by its precision, allows the limit to be set at 0.46%. The Spectralab makes it possible to put this limit closer to the target, at 0.48%.
Based on yield alone, the typical payback time for a Spectralab in a medium sized flour mill is less than 6 months.
- The Spectralab is based on the True AlignmentTM Spectroscopy, that precisely calibrates it to first principle standards and then monitors and maintains the alignment for reliable, trouble free analysis.
- The increased number of data points and increased resolution of the Spectralab make it possible to obtain NIR spectra with a very low noise, which ensures a more precise and detailed measurement of the sample.